The Correct Answer is Option (B)
A p-n
junction
consists
of
a
p-type
semiconductor
(which
has
an
excess
of
holes)
in
contact
with
an
n-type
semiconductor
(which
has
an
excess
of
electrons).
In
a
forward-biased
p-n
junction,
an
external
voltage
is
applied
such
that
the
positive
terminal
is
connected
to
the
p-side
and
the
negative
terminal
is
connected
to
the
n-side.
This
configuration
promotes
the
flow
of
majority
charge
carriers
(holes
from
the
p-side
and
electrons
from
the
n-side)
across
the
junction.
There
are
two
types
of
currents
in
a
p-n
junction:
drift
current
and
diffusion
current.
Drift
current
is
caused
by
the
electric
field
due
to
the
built-in
potential,
which
opposes
the
flow
of
majority
charge
carriers.
Diffusion
current
is
caused
by
the
concentration
gradient
of
the
charge
carriers,
which
promotes
the
flow
of
majority
charge
carriers.
When
the
p-n
junction
is
forward
biased,
the
applied
voltage
reduces
the
potential
barrier,
allowing
more
majority
charge
carriers
to
flow
across
the
junction.
This
results
in
an
increase
in
the
diffusion
current.
In
a
forward-biased
p-n
junction,
the
diffusion
current
is
indeed
greater
than
the
drift
current
in
magnitude,
so
Assertion
A
is
correct.
Regarding
Reason
R:
The
diffusion
current
in
a
p-n
junction
is
actually
from
the
p-side
to
the
n-side,
as
holes
(majority
charge
carriers
in
the
p-side)
move
from
the
p-side
to
the
n-side,
and
electrons
(majority
charge
carriers
in
the
n-side)
move
from
the
n-side
to
the
p-side.
Therefore,
Reason
R
is
incorrect.